Revised
Worksheet
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FXO INC. Re-Analysis of a Dual Computer with Interface Unit FMEA |
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Item / Function |
Potential Failure Mode |
Potential Effect(s) of Failure |
Severity Classification |
Potential Cause(s) Mechanism(s) of Failure |
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C1 Power Supply Regulation |
Open Ckt |
Poor Regulation on the Vdd bus. Output of MUX_A signals subject to ringing and droop |
IV: Minor |
Internal failure, Broken lead, Broken solder joint |
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Short Ckt |
No output from MUX_A. |
II: Loss of Redundancy: Can't use IU bus A |
Electromigration causing capacitor electrodes to short. |
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Change in Capacitance/ Drift |
Poor Regulation on the Vdd bus |
IV: Minor |
Electromigration causes capacitance to change. Or component degrading. |
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C2 Power Supply Regulation |
Open Ckt |
Poor Regulation on the Vdd bus. Output of MUX_A signals subject to ringing and droop |
IV: Minor |
Internal failure, Broken lead, Broken solder joint |
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Short Ckt |
No output from MUX_B. |
II: Loss of Redundancy: Can't use IU bus B |
Electromigration causing capacitor electrodes to short. |
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Change in Capacitance/ Drift |
Poor Regulation on the Vdd bus |
IV: Minor |
Electromigration causes capacitance to change. Or component degrading. |
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R1 Buffering resistance to protect inputs |
Open Ckt |
CONTROL1 signal is opened to MUX A input |
II: Loss of Redundancy: Can't use IU bus A |
Internal failure, Broken lead, Broken solder joint |
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Short Ckt |
No effect |
IV: Minor |
part failure |
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Change in Resistance |
No effect for resistance within 25% |
IV: Minor |
part failure |
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R2 Buffering resistance to protect inputs |
Open Ckt |
CONTROL2 signal is opened to MUX A input |
II: Loss of Redundancy: Can't use IU bus A |
Internal failure, Broken lead, Broken solder joint |
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Short Ckt |
No effect |
IV: Minor |
part failure |
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Change in Resistance |
No effect for resistance within 25% |
IV: Minor |
part failure |
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R3 Buffering resistance to protect inputs |
Open Ckt |
CONTROL1 signal is opened to MUX B input |
II: Loss of Redundancy: Can't use IU bus B |
Internal failure, Broken lead, Broken solder joint |
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Short Ckt |
No effect |
IV: Minor |
part failure |
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Change in Resistance |
No effect for resistance within 25% |
IV: Minor |
part failure |
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R4 Buffering resistance to protect inputs |
Open Ckt |
CONTROL2 signal is opened to MUX B input |
II: Loss of Redundancy: Can't use IU bus B |
Internal failure, Broken lead, Broken solder joint |
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Short Ckt |
No effect |
IV: Minor |
part failure |
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Change in Resistance |
No effect for resistance within 25% |
IV: Minor |
part failure |
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MUX_A Computer control signal multiplexing |
Short circuit between any two adjacent connections |
Pin 1 and Pin 2: The buffered control signals from the redundant computers are shorted. |
II: Loss of Redundancy: Output from Bus A is wrong, but Bus B is good |
Bent pin, broken trace, foreign substance causing the short. |
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Short circuit between any two adjacent connections |
Pin 2 and Pin 3: The control signal from buffered Computer 2 is shorted to the MUX_A output. Causes loss of redundancy |
II: Loss of Redundancy: Can't use IU bus A |
Bent pin, broken trace, foreign substance causing the short. |
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Open circuit on any pin |
Pin 1, or 2 or 3: Loss of the Computer control logic on Side A |
II: Loss of Redundancy: Can't use Bus A |
Bent pin, broken trace, foreign substance causing the short. |
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Input or output stuck hi or low |
Pin 1: Stuck input to MUX A input. |
II: Loss of Redundancy: Can't use Bus A |
Bent pin, broken trace, foreign substance causing the short. |
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Input or output stuck hi or low |
Pin 2: Stuck input on MUX A input. |
II: Loss of Redundancy: Can't use Bus A |
Bent pin, broken trace, foreign substance causing the short. |
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Input or output stuck hi or low |
Pin 3: Stuck output, causes loss of Bus A |
II: Loss of Redundancy: Can't use Bus A |
Bent pin, broken trace, foreign substance causing the short. |
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Simultaneous short on all connections |
All the pins on the chip are shorted together |
II: Loss of Redundancy: Can't use Bus A |
Internal chip failure. |
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Output signal varies by >25% |
Pin 3: output varies by >25%, may cause loss of Bus A |
II: Loss of Redundancy: Can't use Bus A |
Internal chip failure. |
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Parasitic oscillation of outputs |
Pin 3: Output oscillates, causes loss of Bus A |
II: Loss of Redundancy: Can't use Bus A |
Internal chip failure. |
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MUX_B Computer control signal multiplexing |
Short circuit between any two adjacent connections |
Pin 1 and Pin 2: The buffered control signals from the redundant computers are shorted. |
II: Loss of Redundancy: Output from Bus B is wrong, but Bus A is good |
Bent pin, broken trace, foreign substance causing the short. |
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Short circuit between any two adjacent connections |
Pin 2 and Pin 3: The control signal from buffered Computer 2 is shorted to the MUX_B output. Causes loss of redundancy |
II: Loss of Redundancy: Can't use IU bus B |
Bent pin, broken trace, foreign substance causing the short. |
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Open circuit on any pin |
Pin 1, or 2 or 3: Loss of the Computer control logic on Side B |
II: Loss of Redundancy: Can't use Bus B |
Bent pin, broken trace, foreign substance causing the short. |
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Input or output stuck hi or low |
Pin 1: Stuck input to MUX B input. |
II: Loss of Redundancy: Can't use Bus B |
Bent pin, broken trace, foreign substance causing the short. |
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Input or output stuck hi or low |
Pin 2: Stuck input on MUX B input. |
II: Loss of Redundancy: Can't use Bus B |
Bent pin, broken trace, foreign substance causing the short. |
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Input or output stuck hi or low |
Pin 3: Stuck output, causes loss of Bus B |
II: Loss of Redundancy: Can't use Bus B |
Bent pin, broken trace, foreign substance causing the short. |
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Simultaneous short on all connections |
All the pins on the chip are shorted together |
II: Loss of Redundancy: Can't use Bus B |
Internal chip failure. |
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Output signal varies by >25% |
Pin 3: output varies by >25%, may cause loss of Bus B |
II: Loss of Redundancy: Can't use Bus B |
Internal chip failure. |
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Parasitic oscillation of outputs |
Pin 3: Output oscillates, causes loss of Bus B |
II: Loss of Redundancy: Can't use Bus B |
Internal chip failure. |
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